XIE, Guangqiao; ZHOU, Yan; WU, Chengshang. DAE-YOLO:An Improved Industrial Surface Defect Detection Algorithm Based on YOLOv11. Computing and Informatics, [S. l.], v. 45, n. 5, 2026. Disponível em: http://147.213.75.17/ojs/index.php/cai/article/view/8174. Acesso em: 1 nov. 2026.