GAO, Huifang; JIN, Yong; LI, Maozhen; CHEN, Youxing; ZANG, Junbin; FAN, Xiaoliang. Bonding Defect Detection Based on Improved Single Shot MultiBox Detector. Computing and Informatics, [S. l.], v. 43, n. 6, p. 1432–1454, 2024. DOI: 10.31577/cai_2024_6_1432. Disponível em: http://147.213.75.17/ojs/index.php/cai/article/view/2024_6_1432. Acesso em: 4 apr. 2025.