Xie, Guangqiao, Yan Zhou, and Chengshang Wu. “DAE-YOLO:An Improved Industrial Surface Defect Detection Algorithm Based on YOLOv11”. Computing and Informatics 45, no. 5 (October 31, 2026). Accessed November 1, 2026. http://147.213.75.17/ojs/index.php/cai/article/view/8174.